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Bruker Japan K. K.
- New Technology
Presentation - WebExpo
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New Technology Presentation
| Date and time | Theme | Hall |
|---|---|---|
| Sept. 6(Wed) 11:00～11:30 | 3D X-ray Microscopy: A non-destructive technique to explore deeper in material research | 201A |
| Sept. 6(Wed) 11:30～12:30 | Latest trends in solution & NMR methods ~Reaction monitoring & high-speed MAS measurement~ | 302 |
| Sept. 6(Wed) 14:15～14:45 | Brand new process FT-NIR Spectrometer System MATRIX-F II: Online process analysis examples | 201B |
| Sept. 6(Wed) 15:45～16:15 | Introduction to Viscoelasticity Measurements Using Atomic Force Microscopy (AFM) and Case Studies. | 101 |
| Sept. 7(Thu) 11:15～11:45 | XRF Analysis of Light Element Matrix Samples including Food & Pharma-WDX &EDX Measurement Examples | 201B |
| Sept. 7(Thu) 14:00～14:30 | Chemical analysis using the latest high-speed infrared microscopic imaging and AI technology | 301A |
| Sept. 7(Thu) 15:30～16:00 | Innovative benchtop X-ray diffraction: Power, Versatility and Ease of Use | 102 |
| Sept. 8(Fri) 10:15～10:45 | Nanoindenter Latest Trend 2023<Nano to micro scale mechanical characterization technology> | 104 |
| Sept. 8(Fri) 11:45～12:15 | Correlative Nanoscale Topographical, Mechanical, Electrical and Chemical Mapping with Bruker nanoIR | 201A |
| Sept. 8(Fri) 12:45～13:15 | What is XRF? What is µXRF for elemental mapping? We introduce the latest technology. | 103 |
| Sept. 8(Fri) 15:45～16:15 | Share a knowhow and introduce a tips of an elemental analysis onto SEM with application data. | 301B |