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Primary instruments to be exhibited
Handheld XRF Analyzer VANTA series, Industrial Nano Search Microscope LEXT OLS4500, Micro Cantilever
HHXRF VANTA provides advantage for metal material control with its portability, quick and precise nondestructive measurement.
LEXT OLS4500 reduces alaysis time dramatially with its unique combination of SPM, LSM and optical microscope.
・Industrial Nano Search Microscope LEXT OLS4500
・Digital Microscope DSX510