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OLYMPUS CORPORATION

Booth No.4A-302 Website
Primary instruments to be exhibited

Handheld XRF Analyzer VANTA series, Industrial Nano Search Microscope LEXT OLS4500, Micro Cantilever

Highlights

HHXRF VANTA provides advantage for metal material control with its portability, quick and precise nondestructive measurement.
LEXT OLS4500 reduces alaysis time dramatially with its unique combination of SPM, LSM and optical microscope.

Related information
Contact
URL http://www.olympus-ims.com/
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