Primary instruments to be exhibited
Surface metrology and image analysis software for profilers and microscopes
Digital Surf is the editor of Mountains surface metrology and image analysis software for profilers and microscopes: Atomic Force Microscopes/SPMs, Scanning Electron Microscopes (SEM), 3D confocal and interferometric microscopes/profilers and hyperspectral analysis. Combine data from more than one microscope type. Achieve fast 3D reconstruction from SEM images and colorization.