Primary instruments to be exhibited
Surface metrology and image analysis software for profilers and microscopes
Digital Surf® is the editor of Mountains® software, a dedicated solution for surface imaging, analysis and metrology for profilers and microscopes: Atomic Force Microscopes (AFM), Scanning Probe Microscopes (SPM), Scanning Electron Microscopes (SEM), 3D confocal and interferometric microscopes, and profilers. Mountains® software helps people visualize, analyze and report on data obtained with all kinds of surface measuring instruments. Combine data from more than one microscope type. Achieve fast 3D reconstruction from SEM images and colorization. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.
・Mountains® software free trial
・MountainsSEM® for Scanning Electron Microscopy
・MountainsSPIP® for Scanning Probe Microscopy